自動車用過渡耐性発生器

1. Basic Understanding of Equipment

1.1 モデル分類

LISUN モデル	EMS-ISO7637-P1235-80V30A	EMS-ISO7637-P123-80V30A	EMS-ISO7637-P5-80V30A
製品名	自動車用過渡耐性発生器		Automotive Electronic Load Dump Simulator
DUTの電圧と電流	Built-in Coupling Decoupling Network: 80 V/30 A (optional: 80 V/50 A and 80 V/100 A)
制御システム	10.1-inch Chinese-English Android Capacitive Touchscreen Display + Supports Remote Control via PC Software
Test Waveforms	Pulse 1, Pulse 2a, Pulse 3a, Pulse 3b, Pulse 5a, Pulse 5b	Pulse 1, Pulse 2a, Pulse 3a, Pulse 3b	Pulse 5a, Pulse 5b
その他	Supports immunity testing for 12V/24V automotive electronic systems; features built-in standard test parameters that can be accessed with a single click, and supports user-defined parameters

1.2 適⽤規格

標準番号	名前
ISO 7637-2：2021	Road Vehicles—Electrical Disturbances from Conduction and Coupling—Part 2: Electrical Transients Conduced Along Supply Lines Only
ISO 7637-3：2016	Road Vehicles—Electrical Disturbances from Conduction and Coupling—Part 3: Electrical Transient Transmission by Capacitive and Inductive Coupling via Lines Other Than Supply Lines
ISO 16750-2：2023	Road Vehicles—Environmental Conditions and Testing for Electrical and Electronic Equipment—Part 2: Electrical Loads

1.3 アプリケーションシナリオ

その EMS-ISO7637 Automotive Transient Immunity Generator (also known as the Automotive Electronic Immunity Test System) is a professional test instrument independently developed by LISUN. It is designed to simulate various typical electromagnetic disturbances generated during normal vehicle operation, as well as changes in the vehicle’s onboard power supply that occur during vehicle startup, the switching of electronic devices, and battery charging and discharging. The waveforms generated by the equipment comply with the ISO 7637 series of international standards and meet the requirements of most automotive manufacturers for in-vehicle electronic immunity testing.

Applications include: conducted immunity testing of electronic components such as automotive ECUs, sensors, and controllers; verification of electromagnetic compatibility (EMC) performance for automotive components prior to shipment; validation and optimization of circuit protection solutions during the R& D phase; and compliance testing by third-party testing laboratories.

2.使用上の注意

2.1 環境要件

Ambient temperature: 23 °C ± 5 °C; relative humidity: 45–75%, non-condensing; altitude: ≤2000 m; no strong vibrations or electromagnetic interference in the surrounding area; use of the equipment in dusty or flammable and explosive environments is strictly prohibited.

2.2 電源要件

Input power supply: AC 220 V ±10%, 50 Hz; Input power: ≤1 kW; The power supply must be reliably grounded, with a grounding resistance of ≤1 Ω; It is recommended to use a voltage-stabilized power supply to prevent power grid fluctuations from affecting test accuracy.

2.3 配線の原理

Use power cables with the specified wire gauge to prevent overheating under high current conditions; keep test cables as short as possible and route them in parallel to minimize the impact of parasitic parameters; ensure that the DUT (Device Under Test) enclosure is reliably connected to the equipment’s protective ground; and route signal and power cables separately to avoid cross-interference.

2.4 運用上の安全ガイドライン

Wear insulated protective gear; before testing, ensure all connections are secure and that there are no exposed conductors; do not plug in or unplug test cables during testing to avoid arc burns; do not touch the DUT or test fixtures while the pulse is being output; if you hear unusual noises, smell an unusual odor, or see smoke, immediately disconnect the power; During prolonged continuous testing, ensure the equipment is properly ventilated for heat dissipation.

3. Equipment Overview and Wiring

3.1 フロントパネル

図3-1を参照してください。

数	お願い
①	Device power switch: Press briefly to turn on; press and hold to turn off.
②	10.1インチの静電容量式タッチスクリーン
③	USB1 port: Used by LISUN engineers for device debugging; users do not need to use it.
④	USB 2.0 port, which can be used to connect a mouse to control the touchscreen, or to connect a USB flash drive to upgrade the software or update database files
⑤	BNC coaxial connector, used to connect auxiliary devices such as ICC, DCC, CCC (if any), or to connect an external oscilloscope to view BNC-coupled waveforms
⑥	DUT power cable connector, used to connect the DUT; observe the polarity

3.2 バックパネル

図3-2を参照してください。

数	お願い
①	Power cord receptacle and fuse; ensure the input power supply is properly grounded
②	Circuit breaker, main input power supply switch for the equipment
③	Protective grounding terminal: If the input power supply does not have a reliable ground connection, a separate ground wire must be used to connect it to the ground.
④	DUT Power Input Connector: A suitable external power supply must be provided for the DUT. You may use LISUN’s LIS-APS series four-quadrant power supply, or another suitable DC regulated power supply appropriate for the DUT. Pay attention to polarity.
⑤	DUT Power Switch
⑥	RS485 interface/LAN port, which can be connected to a computer to use the host software (for backup purposes). The host software offers the same functionality as the touchscreen; please contact us if needed.

3.3 アクセサリー入門

図3-3を参照してください。

数	お願い
①	電源コード
②	DUT Power Supply Input and Output Cables
③	The slim-profile output cable can be used to connect to LISUN’s calibration resistor, the LIS-CAR.
④	アース線
⑤	BNC adapter, used to connect to an external oscilloscope to view power line-coupled waveforms; be sure to observe the correct polarity when using it.
⑥	Insulation Protective Covers for DUT Input and Output Power Cables
⑦	Ethernet cable, used to connect a computer for use with host software

4. Introduction to the Touchscreen Program

4.1 テストインターフェース

4.1.1 The Pulse 1 Interface

図4-1を参照してください。

数	お願い
①	Waveform Selection: Click to select “Pulse 1”
②	Schematic Diagram of Pulse 1 Waveform
③	Pulse 1 Standard Source and Test Instructions
④	Electrical System: Optional built-in 12V/24V system waveform parameters; custom parameters are also available.
⑤	Severity Levels: Select the appropriate severity level for each waveform as specified in the standard, as needed.
⑥	Load the test parameters saved by the device; this is generally not necessary. If you have previously customized parameters, you can load them.
⑦	Save the current test parameters. If you have custom parameters, you can click to save the current custom parameters to the device. You can manage them in the Files interface.
⑧	Pulse voltage: The built-in system waveform parameters have been set according to the standard and cannot be modified. When configuring custom parameters, you can set the pulse peak voltage Us.
⑨	Pulse Period: You can set the period of a single pulse; unless otherwise specified, use the default value.
⑩	Power-off time: the duration for which power to the 12V/24V system is disconnected. The built-in system waveform parameters have been set according to the standard and cannot be modified. These parameters can be set when configuring custom settings.
⑪	Pulse width: The built-in system waveform parameters are set according to the standard and cannot be modified. When configuring custom parameters, you can select the width of a single pulse from among 9 options ranging from 50 us to 2 ms.
⑫	For the rise time, the built-in system waveform parameters have been set according to the standard and cannot be modified. When configuring custom parameters, you can select the rise time for Pulse 1 from the options 1 us or 3 us.
⑬	Number of Pulses: Sets the number of pulses to be output during this operation. Unless otherwise specified, use the default value.
⑭	Power supply internal resistance: The built-in system waveform parameters have been set according to the standard and cannot be modified. When configuring custom parameters, you can select the internal resistance of the pulse source from the following options: 2 Ω, 4 Ω, 10 Ω, 30 Ω, 50 Ω, 60 Ω, and 100 Ω.
⑮	Runtime is displayed and calculated automatically; a progress bar will appear to show the test progress once the test begins.
⑯	DUT: Click to turn on the DUT power; click again to turn it off.
⑰	RUN: Once you have selected the waveform and other parameters, click this button to start the test. During the test, the progress bar updates once per second to show the current progress until the test is complete. Click this button again during the test to stop the current test.

4.1.2 Pulse 2a Interface

図4-2を参照してください。

数	お願い
①	Waveform Selection: Click to select Pulse 2a
②	Pulse 2a Waveform Diagram
③	Pulse 2a Reference Sources and Test Instructions
④	Electrical System: Optional built-in 12V/24V system waveform parameters; custom parameters are also available.
⑤	Severity Levels: Select the appropriate severity level for each waveform as specified in the standard, as needed.
⑥	Load the test parameters saved by the device; this is generally not necessary. If you have previously customized parameters, you can load them.
⑦	Save the current test parameters. If you have custom parameters, you can click to save them to the device. You can manage them in the Files interface.
⑧	Pulse voltage: The built-in system waveform parameters have been set according to the standard and cannot be modified. When configuring custom parameters, you can set the pulse peak voltage Us.
⑨	Pulse Period: You can set the period for a single pulse; unless otherwise specified, use the default value.
⑩	Pulse width: The built-in system waveform parameters are preconfigured according to the standard and cannot be modified. When configuring custom parameters, you can select the width of a single pulse from among 9 options ranging from 50 us to 2 ms.
⑪	For the rise time, the built-in system waveform parameters have been set according to the standard and cannot be modified. When configuring custom parameters, you can set the pulse rise time.
⑫	Number of Pulses: Set the number of pulses to be output during this operation. Unless otherwise specified, use the default value.
⑬	The power supply’s internal resistance and the built-in system waveform parameters have been set according to the standard and cannot be modified. The power supply’s internal resistance can be modified when configuring custom parameters.
⑭	Coupling methods: Choose between power line output or BNC coaxial connector output. The coaxial output supports ICC (requires LISUN’s LIS-BCP110 ICC Current Injection Probe and LIS-CCF500 ICC High-Current Injection Probe) and DCC (requires LISUN’s DCC-100 DCC Coupling Capacitor).
⑮	Runtime is displayed and calculated automatically; a progress bar will appear to show the test progress once the test begins.
⑯	DUT: Click to turn on the DUT power; click again to turn it off.
⑰	RUN: Once you have selected the waveform and other parameters, click this button to start the test. During the test, the progress bar updates once per second to show the current progress until the test is complete. Click this button again during the test to stop the current test.

4.1.3 Pulse 3a/3b Interface

See Figures 4-3 and 4-4.

数	お願い
①	Waveform Selection: Click to select Pulse 3a/3b
②	Schematic Diagram of Pulse 3a/3b Waveforms
③	Pulse 3a/3b Standards Sources and Test Instructions
④	Electrical System: Optional built-in 12V/24V system waveform parameters; custom parameters are also available.
⑤	Severity Levels: Select the appropriate severity level for each waveform as specified in the standard, as needed.
⑥	Load the test parameters saved by the device; this is generally not necessary. If you have previously customized parameters, you can retrieve them.
⑦	Save the current test parameters. If you have custom parameters, you can click to save them to the device. You can manage them in the Files interface.
⑧	Pulse voltage: The built-in system waveform parameters have been set according to the standard and cannot be modified. When configuring custom parameters, you can set the pulse peak voltage Us.
⑨	Pulse duration: The built-in system waveform parameters are already set according to the standard and cannot be modified. When configuring custom parameters, you can set the duration of the pulse group.
⑩	Interval Time: The built-in system waveform parameters have been set according to the standard and cannot be modified. When configuring custom parameters, you can set the interval time between pulse groups.
⑪	Pulse frequency: The built-in system waveform parameters are already set according to the standard and cannot be modified. When configuring custom parameters, you can set the frequency of the output pulses within a pulse group.
⑫	Pulse width: The built-in system waveform parameters are already set according to the standard and cannot be modified. When configuring custom parameters, you can set the pulse group width.
⑬	For the rise time, the built-in system waveform parameters have been set according to the standard and cannot be modified. The pulse rise time can be set when configuring custom parameters.
⑭	Coupling methods: You can choose between power cord output or BNC coaxial connector output. The coaxial output supports two coupling methods: CCC (requires LISUNさん VFTC capacitive coupling clamp) and DCC (requires LISUN’s DCC-100 DCC coupling capacitor).
⑮	Runtime: Configurable; the standard minimum test duration is 3600 seconds.
⑯	DUT: Click to turn on the DUT’s power; click again to turn it off.
⑰	RUN: Once you have selected the waveform and other parameters, click this button to start the test. During the test, the progress bar updates once per second to show the current progress until the test is complete. Click this button again during the test to stop the current test.

4.1.4 Pulse 5a/5b Interface

4.1.4.1 ISO 7637-2

See Figures 4-5 and 4-6.

数	お願い
①	Waveform Selection: Click to select Pulse 5a/5b
②	Schematic Diagram of Pulse 5a/5b Waveforms
③	Select the ISO 7637-2 standard
④	Pulse 5a/5b Standard Sources and Test Instructions
⑤	Electrical System: Optional built-in 12V/24V system waveform parameters; custom parameters are also available.
⑥	Severity Levels: Select the appropriate severity level for each waveform as specified in the standard, as needed.
⑦	Load the test parameters saved by the device; this is generally not necessary. If you have previously customized parameters, you can load them.
⑧	Save the current test parameters. If you have custom parameters, you can click to save them to the device. You can manage them in the Files interface.
⑨	Pulse Voltage: You can set the pulse peak voltage (Us) for Pulse 5a and the pulse clamping voltage (Us*) for Pulse 5b. Unless otherwise specified, use the default values.
⑩	Pulse Period: You can set the period for a single pulse. Unless otherwise specified, use the default value.
⑪	Pulse width: You can set the width of a single pulse; unless otherwise specified, use the default value.
⑫	Rise Time: You can set the rise time of the pulse. Unless otherwise specified, use the default value.
⑬	Number of Pulses: You can set the number of pulses to be output during this operation. Unless otherwise specified, use the default value.
⑭	Power Supply Internal Resistance: The internal resistance of the pulse source can be set within a range of 0.5 Ω to 40 Ω, with a resolution of 0.1. Unless otherwise specified, use the default value.
⑮	Current Cycle Duration Display
⑯	Total Runtime Display
⑰	DUT: Click to turn on the DUT power; click again to turn it off.
⑱	RUN: Once you have selected the waveform and other parameters, click this button to start the test. During the test, the progress bar updates once per second to show the current progress until the test is complete. Clicking this button again during the test will stop the current test.

4.1.4.2 ISO 76750-2

See Figures 4-7 and 4-8.

数	お願い
①	Select the ISO 16750-2 standard
②	The DUT’s supply voltage must be entered; all other requirements are consistent with ISO 7637-2.

4.2 Database File Interface

See Figures 4–9.

数	お願い
①	Test Plan Standard Library Management. You can manage the custom test parameters you have saved; do not modify or delete the test parameters built into the device.
②	If you have other standard tests but do not wish to create custom tests, please contact us and send us the details of the relevant standards. We will guide you through the process of updating the database file with those standards directly using a USB drive.

4.3 設定インターフェース

図4-10を参照してください。

数	お願い
①	Switch Between Chinese and English
②	Communication settings are set to “LOCAL” by default. If you need to use host computer software, you can switch to the RS485 or LAN port. Please contact us.
③	音量設定

4.4 About the Interface

For device information, firmware version, and copyright notice, see Figure 4-11.

5. Procedures for Automotive Electronic Transient Immunity Testing

5.1 Define the Purpose of the Test

Waveform	実験の目的
パルス1	Verification of the immunity of in-vehicle electronic devices to reverse voltage surges caused by the de-energization of inductive loads
パルス2a	Verify the device’s immunity to forward voltage spikes caused by stray inductance in the power supply harness
パルス3a/3b	Verification of the device’s immunity to high-speed, periodic, narrow pulse trains generated by arcing in mechanical switches
パルス5a/5b	Simulate generator load shedding conditions to verify the equipment’s ability to withstand high-energy voltage spikes

5.2 一般的な操作手順

5.2.1配線

Ensure that both the equipment and the DUT are powered off; use a test cable to connect the DUT output port on the equipment to the power input port of the device under test (DUT); Use a cable to connect an external power supply (LIS-APS or other regulated DC power supply) to the DUT input power supply connector on the back of the EMS-ISO7637; if external auxiliary equipment is required, complete the wiring as specified.

5.2.2 Parameter Settings

Set the test parameters as described in Section 4.1.

5.2.3 Test Execution Steps

Turn on the external power supply and check the DUT output; turn on the DUT power switch on the back of the EMS-ISO7637; switch to the corresponding waveform test interface, tap the DUT button on the touchscreen to verify that the DUT is operating normally; tap the RUN button to start the test; Observe the DUT’s operating status and record any observations; wait for the test to complete—in case of an emergency, press the Stop button to halt the test immediately.

5.3 結果の評価

Grade A: Functionality is normal during and after testing, with no abnormalities; Grade B: Functionality is temporarily degraded or interrupted during testing but automatically recovers after testing; Grade C: Functionality fails during testing and requires manual intervention to recover; Grade D: The equipment is permanently damaged after testing and cannot be restored.

Standard requirements of major automakers: In-vehicle safety components must meet Grade A standards; for in-vehicle electrical systems and infotainment systems, Grade B may be accepted by mutual agreement, while Grade D is uniformly deemed non-compliant.

5.4 Procedures at the End of the Test

Ensure that both the equipment and the DUT are powered off; wait until the high-voltage capacitors have fully discharged (it is recommended to wait at least 5 minutes); first disconnect the DUT-side connections, then disconnect the equipment-side connections; disconnect the grounding wire and any connections to auxiliary equipment.

6. Daily Maintenance and Care of Equipment

6.1 毎日の清掃

6.1.1 Cleaning Schedule and Procedures

各使用後: Clean the touchscreen surface and remove dust from the device panel;

毎週: Clean the equipment housing and the filters in the vents;

月額: Clean dust from inside the equipment (to be performed by a professional).

クリーニング手順

Wipe the exterior with a clean, soft, lint-free cloth; use a specialized screen cleaner for the touchscreen; clean the vents with a soft-bristled brush and a vacuum cleaner if necessary; do not use corrosive solvents such as acetone.

6.2 定期点検

Check the power cord for damage or wear; check that the ground connection is secure; check that the fan is operating normally; check that the buttons and touchscreen are responsive; check the terminals for oxidation or looseness.

6.3 保管と取り扱い

6.3.1 Long-Term Storage Requirements

Storage Conditions: Temperature: -10°C to +50°C; Humidity: ≤85%. Clean the equipment and apply dust protection before storage. Power on the equipment once every 3 months, running it for at least 30 minutes each time. Avoid stacking or applying heavy pressure to prevent the panel from warping.

6.3.2 Precautions for Handling

Unplug all external cables before moving the equipment; use the original packaging and ensure it is properly cushioned and protected; keep the equipment upright during transport and avoid severe vibrations; when lifting, grip the bottom and sides of the equipment; do not lift by the panel.

6.4 Calibration Interval Requirements

To ensure the measurement accuracy and operational reliability of the equipment, it is recommended that it be sent periodically to a qualified third-party metrology laboratory for calibration. The recommended calibration interval is 12 months. Users may determine the specific calibration interval based on frequency of use, environmental conditions, and quality system requirements.

7. Troubleshooting and Resolving Common Problems

障害症状	考えられる原因	手順
The device won’t turn on	The input power supply main power switch on the back is not turned on, or the fuse has blown.	Turn on the input power supply switch located at the power cord socket on the back of the device; check the fuse, and if it has blown, replace it with a fuse of the same specification.
Touchscreen Malfunction After Power-On	System freeze, loose ribbon cable	If the problem persists after restarting, disconnect the power, remove the device’s casing, and check whether the touchscreen ribbon cable is loose.
No pulse output after clicking “RUN”	The DUT did not start up properly	Verify that all connections are secure. Click “DUT” to ensure the DUT is in normal operating condition, then click “RUN” to start the test.
Test Stopped Automatically Midway	Over-temperature protection triggered, overcurrent/overvoltage protection triggered, external power supply interruption	Check whether the equipment’s ventilation is obstructed or the ambient temperature is too high; check the DUT for short circuits or overloads; check whether the external power supply has stopped outputting power.
USBドライブが認識されない	USB drive format is incompatible or has too much storage capacity	Use a FAT32-formatted USB drive with a capacity of no more than 32 GB; if that doesn’t work, try a different USB drive.